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BrightBox — A rough set based technology for diagnosing mistakes of machine learning models

Autor
Ślęzak, Dominik
Sikora, Marek
Ludziejewski, Jan
Biczyk, Piotr
Wawrowski, Łukasz
Zalewska, Andżelika
Janusz, Andrzej
Data publikacji
2023
Abstrakt (EN)

The paper presents a novel approach to investigating mistakes in machine learning model operations. The considered approach is the basis for BrightBox – a diagnostic technology that can be used for analyzing prediction models and identifying model- and data-related issues. The idea is to generate surrogate rough set-based models from data that approximate decisions made by monitored black-box models. Such approximators are used to compute neighborhoods of instances that undergo the diagnostic process — the neighborhoods consist of historical instances that were processed in a similar way by rough set-based models. The diagnostic process is then based on the analysis of mistakes registered in such neighborhoods. The experiments performed on real-world data sets confirm that such analysis can provide us with efficient and valid insights about the reasons for the poor performance of machine learning models.

Słowa kluczowe EN
Machine learning diagnostics
Surrogate models
Model approximation
Rough sets
Ensembles of reducts
Explainable artificial intelligence
BrightBox technology
Dyscyplina PBN
informatyka
Czasopismo
Applied Soft Computing Journal
Tom
141
Strony od-do
110285, 1-14
ISSN
1568-4946
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